US 7,952,365 B2 · Resonator, printed board, and method for measuring complex dielectric constant

Abstract

A plurality of through-hole vias connected to conductor layers is disposed with gaps left between these vias around opening parts disposed in the conductor layers in a printed board in which these conductor layers are disposed parallel to each other so as to sandwich a dielectric layer in between. Furthermore, through-hole vias used for excitation are disposed in the opening parts of the conductor layers and regions of the dielectric layer matching these opening parts in a non-contact manner with the conductor layers. When the complex dielectric constant is measured, a high-frequency power is applied to the through-hole vias, and the power loss between the through-hole vias and the conductor layers is measured by the S parameter method. As a result, the complex dielectric constant and the frequency dependency of this complex dielectric constant can be measured with a high precision in a frequency range extending from several gigahertzes to 20 GHz, and there is no electrical interference with other parts even when this resonator is mounted on a board.

Claims13

Dependent claims

A resonator for measuring a complex dielectric constant which measures the complex dielectric constant of a dielectric layer, said resonator for measuring a complex dielectric constant comprising:

first and second conductor layers disposed parallel to each other so as to sandwich said dielectric layer in between;
a first opening part formed in said first conductor layer and a second opening part formed in said second conductor layer, said second opening part facing said first opening part;
a plurality of first through-hole vias which are disposed, forming a loop around said first and second opening parts when viewed from a direction perpendicular to a surface of said dielectric layer, with gaps left in between, wherein each gap is a distance between adjacent first through-hole vias, and wherein said first through-hole vias connect said first and second conductor layers to each other;
and
second through-hole vias formed, without being in contact with said first and second conductor layers, in said first and second opening parts and in regions of said dielectric layer corresponding to said first and second opening parts.

2 more elements

A method for measuring the complex dielectric constant of a dielectric layer, said method for measuring a complex dielectric constant comprising the steps of:

applying a high-frequency electric power to second through-hole vias of a resonator, said resonator having
first and second conductor layers disposed parallel to each other so as to sandwich said dielectric layer in between,
a first opening part formed in said first conductor layer and a second opening part formed in said second conductor layer, said second opening part facing said first opening part,
a plurality of first through-hole vias which are disposed, forming a loop around said first and second opening parts when viewed from a direction perpendicular to a surface of said dielectric layer, with gaps left in between, wherein each gap is a distance between adjacent first through-hole vias, and wherein said first through-hole vias connect said first and second conductor layers to each other, and
said second through-hole vias formed, without being in contact with said first and second conductor layers, in said first and second opening parts and in regions of said dielectric layer corresponding to said first and second opening parts;
and
measuring the power loss between said second vias and said first and second conductor layers by the S parameter method.

4 more elements

Dependencies are inferred from the claim text.

Resonator, printed board, and method for measuring complex dielectric constant

Life of this patent

Resonator, printed board, and method for measuring complex dielectric constant

Life of this patent

Abstract

Claims13