US 7,925,944 B2Granted

Semiconductor device

AssigneePanasonic Corporation

InventorsMasaya Hirose, Takeshi Yamamoto, Kinya Daio, Kenji Watanabe

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Abstract

In a semiconductor device including an N-line M-stage shift register circuit operated at high speed of, for example, several hundreds MHz. Input circuits input a common test pattern to each of pairs of shift registers in, for example, two lines out of the N lines. A plurality of outputs of the pairs of shift registers in the two lines are compared in comparators, and the comparison results are output. The N-line M-stage shift register circuit and the comparators are operated in synchronization with a clock signal at several hundreds MHz. Hence, even when the circuit scale (area) of the N-line M-stage shift register circuit is increased to involve apparent wiring delay, a defect in the shift register circuit can be detected at an actual speed.

Claims3

Dependent claims

A semiconductor device comprising:

a N-line M-stage shift register circuit including shift registers of M-stages in N lines in parallel to each other (where M and N each are an integer equal to or larger than 2), a plurality of sets of shift registers in a plurality of lines out of the N lines being formed in the N-line M-stage shift register circuit,
wherein each of the sets includes:
an input circuit for inputting a common test pattern to a corresponding set of shift registers in a plurality of lines out of the N lines;
and
a comparator for comparing outputs of a corresponding set of the shift registers in the plurality of lines,
each of the sets of shift registers to which the common test pattern is input does not include shift registers in lines adjacent to each other, and
one of two test patterns is input to a set of shift registers in given lines at least two lines apart from each other while the other test pattern is input to another set of shift registers in other lines at least two lines apart from each other, one of the other lines being adjacent to one of the given lines, and the two test patterns having phases opposite to each other in an arbitrary period.

4 more elements

Dependencies are inferred from the claim text.