Black-box host stack latency measurement
AssigneeIntel Corporation
InventorsXiao Hu, Young Guo, Xiaolu Ye
Life of this patent
Estimating the term…
Abstract
A method comprises sniffing an input from a client device to a host device and an output from the host device to the client device; recording a first time parameter in response to a characteristic data unit being inserted into the input that is outputted from a host stack of a host device; recording a second time parameter in response to the output that comprises the characteristic data unit being received by the host stack; and measuring a latency based on the first time parameter, the second time parameter and arrival time of the input and the output at a sniffing point.
Claims20
A method comprising:
- sniffing an input from a client device to a host device and an output from the host device to the client device;
- recording a first time parameter in response to a characteristic data unit being inserted into the input that is outputted from a host stack of a host device;
- recording a second time parameter in response to the output that comprises the characteristic data unit being received by the host stack;
- and
- measuring a latency based on the first time parameter, the second time parameter and arrival time of the input and the output at a sniffing point.
A system, comprising:
- a host device that is coupled to a client device via a network;
- and
- a computing device that is inserted in the network between the host device and the client device to sniff an input to the host device from the client device and an output from the host device to the client device, record a first time parameter in response to a characteristic data unit being inserted into the input that is outputted from a host stack of a host device, record a second time parameter in response to the output that comprises the characteristic data unit being received by the host stack, and measure a latency of the host device based on the first time parameter, the second time parameter and arrival time of the input and the output at the computing device.
A non-transitory machine readable medium comprising:
- a plurality of instructions that in response to being executed result in a computing device sniffing an input from a client device to a host device and an output from the host device to the client device through a network between the host device and the client device;
- recording a first time parameter in response to a characteristic data unit being inserted into the input that is outputted from a host stack of a host device;
- recording a second time parameter in response to the output that comprises the characteristic data unit being received by the host stack;
- and
- measuring a latency of the host device based on the first time parameter, the second time parameter and a first arrival time when the input arrives at the computing device and a second arrival time when the output arrives at the computing device.
Dependencies are inferred from the claim text.