Quality control system, analyzer, and quality control method
AssigneeSysmex Corporation
InventorsTadayuki Yamaguchi, Atsushi Shirakami, Etsuro Shinkai, Yasuhiro Ochi
Life of this patent
Estimating the term…
Loading patent…
AssigneeSysmex Corporation
InventorsTadayuki Yamaguchi, Atsushi Shirakami, Etsuro Shinkai, Yasuhiro Ochi
Estimating the term…
A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measuring the quality control samples; (c) implementing a quality control by the control device based on the collected quality control data; (d) obtaining uncertainty of measurement of analyzer based on uncertainty of analyzer calibration and the quality control data; (e) outputting a result of the quality control; and (f) outputting the uncertainty of measurement is disclosed. A quality control system and an analyzer are also disclosed.
A quality control system comprising a plurality of analyzers and a control device connected to the analyzers via a network, the quality control system comprising:
Dependencies are inferred from the claim text.