Inspection apparatus using template matching method using similarity distribution
AssigneeHitachi High-Technologies Corporation
InventorsYuichi Abe, Mitsuji Ikeda, Yoshimichi Satou, Yasutaka Toyoda
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AssigneeHitachi High-Technologies Corporation
InventorsYuichi Abe, Mitsuji Ikeda, Yoshimichi Satou, Yasutaka Toyoda
Estimating the term…
An inspection apparatus performing template matching of a search image capable of outputting a correct matching position even if a pattern similar to a template exists in the search image is provided. The inspection apparatus includes a template cutout means for cutting out a template from a template selection image, a marginal similarity calculation means for calculating marginal similarity distribution information, which is a similarity distribution of the template selection image to the template, a search image similarity calculation part for calculating search image similarity distribution information, which is a similarity distribution of the search image to the template, a similarity distribution-to-similarity distribution similarity calculation means for calculating similarity distribution-to-similarity distribution similarity information between the marginal similarity distribution information and the search image similarity distribution information, and a matching position determination part for determining a matching position based on the similarity distribution-to-similarity distribution similarity.
An inspection apparatus performing template matching to a search image;
An inspection apparatus performing template matching to a search image;
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