Segmented bitscan for verification of programming
AssigneeSanDisk Corporation
InventorsYan Li, Teruhiko Kamei, Jeffrey W. Lutze
Life of this patent
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Abstract
A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.
Claims6
A method for programming non-volatile storage, comprising:
- subjecting a set of non-volatile storage elements to programming;
- determining whether a first subset of said set of non-volatile storage elements have less than a first number of non-volatile storage elements that have not been properly programmed;
- determining whether a second subset of said set of non-volatile storage elements have less than a second number of non-volatile storage elements that have not been properly programmed, said first subset overlaps with said second subset;
- and
- continuing to subject said set of non-volatile storage elements to programming if said first subset does not have less than said first number of non-volatile storage elements that have not been properly programmed or said second subset does not have less than said second number of non-volatile storage elements that have not been properly programmed.
Dependencies are inferred from the claim text.