Semiconductor device and method of driving the semiconductor device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsHajime Kimura, Yoshifumi Tanada
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AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsHajime Kimura, Yoshifumi Tanada
Estimating the term…
Display irregularities in light emitting devices, which develop due to dispersions per pixel in the threshold value of TFTs for supplying electric current to light emitting elements, are obstacles to increasing the image quality of the light emitting devices. An electric potential in which the threshold voltage of a TFT (105) is either added to or subtracted from the electric potential of a reset signal line (110) is stored in capacitor means (108). A voltage, in which the corresponding threshold voltage is added to an image signal, is applied to a gate electrode of a TFT (106). TFTs within a pixel are disposed adjacently, and dispersion in the characteristics of the TFTs does not easily develop. The threshold value of the TFT (105) is thus cancelled, even if the threshold values of the TFTs (106) differ per pixel, and a predetermined drain current can be supplied to an EL element (109).
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising:
A semiconductor device comprising a plurality of pixels, each pixel including:
A semiconductor device comprising a plurality of pixels, each pixel including:
A method of driving a semiconductor device, the semiconductor device comprising:
A method of driving a semiconductor device, the semiconductor device comprising:
A method of driving a semiconductor device, the semiconductor device comprising:
A method of driving a semiconductor device, the semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.