Semiconductor integrated circuit device, pattern detection method and serial-parallel conversion method
AssigneeKabushiki Kaisha Toshiba
InventorHiroto Fukuhisa
Life of this patent
Estimating the term…
Loading patent…
AssigneeKabushiki Kaisha Toshiba
InventorHiroto Fukuhisa
Estimating the term…
A shift register SR configured to successively take in and hold input serial data on the basis of a first clock signal, a pattern detection section configured to detect a predetermined pattern contained in the serial data taken in the shift resister and a second clock generation section configured to determine timing of output of the serial data held in the shift register on the basis of a result of this detection are provided to detect the desired pattern contained in the serial data in the course of transferring the serial data for conversion from the serial data to parallel data to the shift resister, and to determine timing of conversion to the parallel data on the basis of a result of this detection, thus reducing the latency and achieving an improvement in communication speed and a reduction in circuit area.
A semiconductor integrated circuit device comprising:
A semiconductor integrated circuit device comprising:
A semiconductor integrated circuit device comprising:
A pattern detection method comprising:
A serial-parallel conversion method comprising:
A serial-parallel conversion method comprising:
Dependencies are inferred from the claim text.