Method and product for testing a device under test
AssigneeVerigy (Singapore) Pte. Ltd.
InventorsAlbrecht Schroth, Sabine Funke-Schaeff
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AssigneeVerigy (Singapore) Pte. Ltd.
InventorsAlbrecht Schroth, Sabine Funke-Schaeff
Estimating the term…
In a method of testing a device under test (DUT) using a test device adapted to provide a connection to a central controller, a test procedure activation signal is supplied from the central controller to the test device. A test procedure for testing the DUT is performed on the basis of test procedure data, upon receipt of the test procedure activation signal. The test procedure is adjustable upon receipt of a feedback signal from the DUT. The test procedure is adjusted by 1) receiving a feedback signal from the DUT, 2) determining from the feedback signal properties of a physical connection between the test device and the DUT, and 3) adjusting the test procedure to modify the test signal and compensate for the properties of the physical connection between the test device and the DUT.
A method of testing a device under test using a test device adapted to provide a connection to a central controller, the method comprising:
A non-transitory computer-readable medium in which a computer program is stored, the computer program, when executed by a processor, causing a processor to test a device under test using a test device adapted to provide a connection to a central controller, the method comprising:
Dependencies are inferred from the claim text.