Contactor assembly for integrated circuit testing

A method of testing a semiconductor device under test (DUT), wherein the DUT contains at least two terminals, the method comprising:

• contacting the at least two terminals of the DUT with a contactor assembly, wherein the contactor assembly comprises:
• at least a first contact probe and at least a second contact probe, each probe having a proximal end and distal end;
• a probe holder near the proximal end for keeping the plurality of probes in a parallel and spaced apart manner;
• a contactor holder disposed after the probe holder with respect to the proximal end;
• wherein the contactor holder comprises a stack made up of a base laminate, a top laminate and a cover shaped and dimensioned to fit with the top laminate, the top laminate having two rows of apertures in a staggered manner;
• and a rear face of the cover facing the top laminate has at least one conductive pad in register with an aperture on the top laminate;
• and
• a load board, wherein the distal ends of the plurality of contact probes are operable to terminate on the load board and the load board is operable to connect to a test circuitry;
• wherein the at least two terminals of the DUT are separately contacted with the at least first and second contact probes;
• and
• connecting an electric component across the at least first and second contact probes so that a second signal in the at least second contact probe is derived from a first signal in the at least first contact probe, wherein connecting the electric component across the probes is achieved by providing the apertures in the contactor holder, housing the electrical component and a compressive element within at least one of said apertures, and electrically connecting the electrical component and compressive element to the at least second contact probe through the conductive pad of the contactor assembly.

A method of testing a semiconductor device under test (DUT), wherein the DUT contains a plurality of terminals, the method comprising:

• contacting one of the plurality of terminals of the DUT with a contact probe of a contactor assembly, wherein said contactor assembly comprises
• a plurality of contact probes, each probe having a proximal end and a distal end;
• a probe holder near the proximal end for keeping the plurality of probes in a parallel and spaced apart manner;
• a contactor holder disposed after the probe holder with respect to the proximal end;
• wherein the contactor holder comprises a stack made up of a base laminate, a top laminate and a cover shaped and dimensioned to fit with the top laminate, the top laminate having two rows of apertures in a staggered manner;
• and a rear face of the cover facing the top laminate has at least one conductive pad in register with an aperture on the top laminate;
• and
• a load board, wherein the distal ends of the plurality of contact probes are operable to terminate on the load board and the load board is operable to connect to a test circuitry;
• and
• connecting an electric component to the probe so that a second signal in a connector is derived form a signal transmitted in series from the probe, wherein connecting the electric component to the probe is achieved by providing the apertures in the contactor holder, with each aperture being operable to house the electrical component and a compressive element, housing the electrical component and a compressive element with at least one of said apertures, and electrically connecting the electrical component and compressive element to the connector through the conductive pad of the contactor assembly.