System, device, and method for embedded S-parameter measurement

A s-parameter test circuit embedded on-chip with a device-under-test (DUT), the circuit comprising:

• a directional coupler for sampling a forward signal at RF or microwave frequencies conveyed to the DUT and for sampling a reverse signal at RF or microwave frequencies reflected by the DUT;
• a peak detector electrically connected without a cable or external connector to the directional coupler for directly detecting a magnitude of a signal at the RF or microwave frequencies of the reverse signal reflected by the DUT conveyed to the peak detector by the directional coupler;
• and
• a phase detector electrically connected without a cable or external connector to the directional coupler for determining a phase of a signal at the RF or microwave frequencies of the reverse signal reflected by the DUT conveyed to the phase detector by the directional coupler.

A method of determining or measuring a s-parameter using a s-parameter test circuit embedded on-chip with a device-under-test (DUT), the method comprising:

• sampling a portion of a signal at RF or microwave frequencies conveyed to the DUT without using a cable or external connector;
• conveying the sampled portion of the signal to a peak detector and a phase detector without using a cable or external connector;
• sampling at least one of a signal at RF or microwave frequencies conveyed from the DUT and a signal at RF or microwave frequencies reflected by the DUT without using a cable or external connector;
• conveying, without using a cable or external connector, the sampled portion of the signal conveyed from the DUT when the signal is conveyed from the DUT and sampled;
• and
• conveying, without using a cable or external connector, the sampled portion of the signal reflected by the DUT when the signal is reflected by the DUT,
• wherein the peak detector and phase detector measure or determine magnitude and phase directly at the RF or microwave frequencies of the DUT.