Procedure for testing the function of a lamp circuit
AssigneeConti Temic microelectronic GmbH
InventorsUli Joos, Jochen Zwick, Nicolai Jeutner
Life of this patent
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Abstract
The function of a lamp circuit is tested by measuring the current and voltage. A resistance value is taken into account which is specified as a polynomial of at least the 1st order depending on the effective measured voltage on the lamp circuit. The parameters of the polynomial are determined by a quantity of measurements which correspond to the order of the polynomial, under operating conditions which are known to differ, and the specific resistance value or a value derived from it are compared with a specified value.
Claims9
A method for testing the function of a lamp circuit, having at least one lamp, the method comprising:
- measuring a current and voltage of the lamp circuit;
- specifying a resistance value as a polynomial having an order, depending on the measured voltage of the lamp circuit, wherein parameters of the polynomial are determined by a number of measurements which at least correspond to the order of the polynomial when operating conditions are known to differ, and the resistance value or a value derived from the resistance value are compared with a specified value.
Dependencies are inferred from the claim text.