US 7,924,017 B2Granted

Measuring device, measuring probe, and method of operating the measuring device

AssigneeMettler-Toledo AG

InventorsJürgen Ammann, Jiangdong Di, René Rissi, Antonio De Agostini, Klaus-Dieter Anders

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Abstract

The measuring device has at least one measuring probe, e.g., a physical or electrochemical measuring probe, which is equipped with one or more memory units and which is connected through a cable, e.g., a coaxial cable, to a transmitter which includes a processor. The measuring probe has a ground wire and is connected to the memory unit through a first signal wire, wherein under the control of the processor in accordance with a transmission protocol, the first signal wire and a connecting cable serve for the unidirectional transmission of the analog or digital measuring signal of the measuring probe as well as the preferably bidirectional transmission between the measuring probe and the transmitter of digital operating data which are read from or to be written into the memory unit.

Claims41

Dependent claims

A measuring device, comprising:

a housing;
a measuring probe included in the housing, the measuring probe having a terminal in the housing and constituting an external interface to the housing;
a transmitter external to the housing and including a first processor;
and
a cable connected to the first processor and the terminal,
wherein the measuring probe comprises:
at least one memory unit;
a first signal wire connected to a terminal, which is configured to be connected to the first processor of the transmitter;
a second processor configured to:
process measuring signals of the measuring probe;
communicate the processed measuring signals to the first processor of the transmitter via the first signal wire and the terminal;
read operating data recorded in the at least one memory unit;
transmit the read operating data to the first processor via the first signal wire and the terminal;
receive operating data from the first processor via the first signal wire and the terminal;
and
write the received operating data into the at least one memory unit;
a reference electrode;
a measuring electrode;
a multiplexer including a first input, a second input, and an output, the output of the multiplexer being connected to the second processor;
a first impedance converter connected between the reference electrode and the first input of the multiplexer;
and
a second impedance converter connected between the measuring electrode and the second input of the multiplexer;
wherein the multiplexer has a third input,
wherein the measuring probe comprises a differential amplifier including a first input, a second input, and an output, the output of the differential amplifier being connected to the third input of the multiplexer, and
wherein the first and second inputs of the differential amplifier are respectively connected to outputs of the first and second impedance converters.

22 more elements

A measuring probe, configured to measure process parameters of a process material, comprising:

a housing;
at least one memory unit included in the housing;
a terminal included in the housing and configured to be connected to a transmitter external to the housing;
a first signal wire connected to the terminal in the housing;
and
a processor included in the housing, the processor being configured to:
process measuring signals of the measuring probe;
communicate the processed measuring signals to the first processor of the transmitter via the first signal wire and the terminal;
read operating data recorded in the at least one memory unit;
transmit the read operating data to the first processor via the first signal wire and the terminal;
receive operating data from the first processor via the first signal wire and the terminal;
and
write the received operating data into the at least one memory unit;
a reference electrode;
a measuring electrode;
a multiplexer including a first input, a second input, and an output, the output of the multiplexer being connected to the processor;
first impedance converter connected between the reference electrode and the first input of the multiplexer;
a second impedance converter connected between the measuring electrode and the second input of the multiplexer;
and
a differential amplifier including a first input, a second input, and an output,
wherein the multiplexer has a third input connected to the output of the differential amplifier, and
wherein the first and second inputs of the differential amplifier are respectively connected to outputs of the first and second impedance converters.

19 more elements

A method of controlling a measuring device, the measuring device comprising a measuring probe including a housing and a processor within a housing of the measuring probe, the processor being configured to process parameters of a process material and to communicate with a transmitter external to the housing of the measuring probe, the measuring probe comprising a reference electrode and a measuring electrode, the method comprising:

processing, by the processor, measuring signals of the measuring probe;
communicating, by the processor, the processed measuring signals to the transmitter;
reading, by the processor, operating data recorded in a computer-readable medium of the measuring device
transmitting, by the processor, the read operating data to the transmitter;
receiving, by the processor, operating data from the transmitter;
writing, by the processor, the received operating data into the computer readable medium of the measuring device;
converting measuring signals of the reference electrode by an impedance converter;
converting measuring signals of the measuring electrode by an impedance converter;
choosing, by a multiplexer, to input to the processor for processing one of an output of the impedance converter of the reference electrode and an output of the impedance converter of the measuring electrode;
and
determining a difference between the output of the impedance converter of the reference electrode and the output of the impedance converter of the measuring electrode,
wherein the step of choosing, by the multiplexer, includes choosing to input to the processor for processing one of the output of the impedance converter of the reference electrode, the output of the impedance converter of the measuring electrode, and the difference.

9 more elements

Dependencies are inferred from the claim text.