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US 7,923,987 B2Granted
Magnetic sensor integrated circuit with test conductor
AssigneeInfineon Technologies AG
InventorUdo Ausserlechner
Life of this patent
Estimating the term…
Abstract
A magnetic sensor integrated circuit includes a plurality of magnetically sensitive elements, and at least one test conductor positioned adjacent to at least one of the magnetically sensitive elements and configured to generate a differential magnetic field that is adapted to be applied to the plurality of magnetically sensitive elements during a test mode.
Claims16
A magnetic sensor integrated circuit, comprising:
- a plurality of magnetically sensitive elements;
- at least one test conductor positioned within the integrated circuit adjacent to at least one of the magnetically sensitive elements and configured to conduct a current that generates a differential magnetic field that is adapted to be applied to the plurality of magnetically sensitive elements during a test mode, wherein the differential magnetic field points in a first direction for a first set of the magnetically sensitive elements and points in a second direction opposite to the first direction for a second set of the magnetically sensitive elements;
- and
- a circuit for varying an amplitude of the current through the at least one test conductor and determining a lowest amplitude of the current that makes an output signal switch states.
1 more element
A method of testing a magnetic sensor integrated circuit, comprising:
- providing a magnetic sensor integrated circuit having a plurality of magnetically sensitive elements and at least one test conductor positioned within the integrated circuit adjacent to at least one of the magnetically sensitive elements;
- causing the integrated circuit to enter a test mode;
- generating a current through the at least one test conductor during the test mode, thereby generating a differential magnetic field that is adapted to be applied to the plurality of magnetically sensitive elements;
- monitoring an output signal of the integrated circuit while in the test mode;
- varying an amplitude of the current through the at least one test conductor;
- and
- determining a lowest amplitude of the current that makes the output signal switch states.
4 more elements
A method of testing a magnetic sensor integrated circuit, comprising:
- providing a magnetic sensor integrated circuit having a plurality of magnetically sensitive elements and at least one test conductor positioned within the integrated circuit adjacent to at least one of the magnetically sensitive elements;
- causing the integrated circuit to enter a test mode;
- generating a current through the at least one test conductor during the test mode, thereby generating a differential magnetic field that is adapted to be applied to the plurality of magnetically sensitive elements;
- monitoring an output signal of the integrated circuit while in the test mode;
- and
- applying a homogeneous magnetic field to the magnetic sensor simultaneously with the differential magnetic field.
3 more elements
Dependencies are inferred from the claim text.