Photosensitive composition, compound for use in the photosensitive composition and pattern forming method using the photosensitive composition
AssigneeFUJIFILM Corporation
InventorKenji Wada
Life of this patent
Estimating the term…
Loading patent…
AssigneeFUJIFILM Corporation
InventorKenji Wada
Estimating the term…
The invention provides a photosensitive composition for use in the production process of a semiconductor such as IC, in the production of a circuit substrate of liquid crystal, thermal head and the like or in other photofabrication processes, a pattern forming method using the photosensitive composition, and a specific organic acid, which are: a photosensitive composition comprising a compound having a proton acceptor functional group and producing a sulfonic acid group upon irradiation with actinic rays or radiation to reduce or lose the acceptor property or change the proton acceptor functional group to be acidic, or a compound capable of generating a specific organic acid upon irradiation with actinic rays or radiation; a pattern forming method using the photosensitive composition; and a specific organic acid.
A photosensitive composition comprising (A) a compound capable of generating an organic acid represented by the following formula (I) upon irradiation with actinic rays or radiation:
The photosensitive composition as claim in claimed 3, which further comprises a compound capable of generating an organic acid upon irradiation with actinic rays or radiation other than the compound (A).
Dependencies are inferred from the claim text.