Apparatus and methods for ion beam implantation using ribbon and spot beams
OwnerJiong Chen, Nicholas R. Whiteinventors
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OwnerJiong Chen, Nicholas R. Whiteinventors
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An ion implantation apparatus with multiple operating modes is disclosed. The ion implantation apparatus has an ion source and an ion extraction means for extracting a ribbon-shaped ion beam therefrom. The ion implantation apparatus includes a magnetic analyzer for selecting ions with specific mass-to-charge ratio to pass through a mass slit to project onto a substrate. Multipole lenses are provided to control beam uniformity and collimation. A two-path beamline in which a second path incorporates a deceleration or acceleration system incorporating energy filtering is disclosed. Finally, methods of ion implantation are disclosed in which the mode of implantation may be switched from one-dimensional scanning of the target to two-dimensional scanning.
A method of accelerating an ion beam having an initial energy to a final higher energy and final direction while substantially eliminating contaminant ions and neutral atoms having energies other than the final energy, the method comprising:
A method of decelerating an ion beam having an initial energy to a final higher energy and final direction while substantially eliminating contaminant ions and neutral atoms having energies other than the final energy, the method comprising:
A system of accelerating an ion beam having an initial energy to a final higher energy and final direction while substantially eliminating contaminant ions and neutral atoms having energies other than the final energy, the system comprising:
A system of decelerating an ion beam having an initial energy to a final higher energy and final direction while substantially eliminating contaminant ions and neutral atoms having energies other than the final energy, the system comprising:
An ion implantation apparatus comprising:
Dependencies are inferred from the claim text.