Determination of values of physical parameters of one or several components of an electronic circuit or of a microelectro-mechanical system

A computer-implemented method for determining a number n of first values of at least one physical property of one or several components of an electronic circuit or of a microelectromechanical system, comprising the steps of:

• in a processor, determining, for each of at least p physical parameters of the component or of said several components of the electronic circuit or of the microelectromechanical system, n second values by
• determining a plurality (n) of vectors of dimension p, each component of each of the plurality of vectors corresponding to one of n initial values of one of said physical parameters;
• iteratively modifying at least one of the plurality (n) of vectors to bring to a maximum, at least locally, for each pair of vectors from among pairs of said plurality (n) of vectors, the smallest average of the sum of distances between the vectors of said pair projected onto sub-spaces of dimension k, where k belongs to a set of integers ranging between 1 and p and at least comprising 1, 2, and p, the components of each of the plurality (n) of vectors corresponding, at the end of the iterations;
• and
• generating an output indicative of said experiment values of the physical parameters for said components;
• and
• in said processor, measuring, for each second value of the p physical parameters, the first corresponding value of the physical property.

A system for determining for each of at least p physical parameters of one or several components of an electronic circuit or of a microelectromechanical system, a number n of experiment values, comprising:

• an entry interface capable of receiving number n;
• and
• a digital central processing unit capable of implementing the steps of:
• determining a plurality (n) of vectors of dimension p, each component of each of the plurality of vectors corresponding to one of n initial values of one of said physical parameters;
• iteratively modifying at least one of the plurality (n) of vectors to bring to a maximum, at least locally, for each pair of vectors from among pairs of said plurality (n) of vectors, the smallest average of the sum of distances between the vectors of said pair projected onto sub-spaces of dimension k, where k belongs to a set of integers ranging between 1 and p and at least comprising 1, 2, and p, the components of each of the plurality (n) of vectors corresponding, at the end of the iterations;
• and
• generating an output indicative of said experiment values of the physical parameters for said components.

A system for determining for each of at least p physical parameters of one or several components of an electronic circuit or of a microelectromechanical system, a number n of experiment values, comprising:

• an entry interface capable of receiving number n;
• and
• a digital central processing unit capable of implementing the steps of:
• determining, for each of at least p physical parameters of the component or of said several components of the electronic circuit or of the microelectromechanical system, n second values by
• determining a plurality (n) of vectors of dimension p, each component of each of the plurality of vectors corresponding to one of n initial values of one of said physical parameters;
• iteratively modifying at least one of the plurality (n) of vectors to bring to a maximum, at least locally, for each pair of vectors from among pairs of said plurality (n) of vectors, the smallest average of the sum of distances between the vectors of said pair projected onto sub-spaces of dimension k, where k belongs to a set of integers ranging between 1 and p and at least comprising 1, 2, and p, the components of each of the plurality (n) of vectors corresponding, at the end of the iterations;
• and
• generating, an output indicative of said experiment values of the physical parameters for said components;
• and
• measuring, for each second value of the p physical parameters, the first corresponding value of the physical property.