Processor test system utilizing functional redundancy
AssigneeGlobalfoundries Inc.
InventorsMichael L. Choate, Mark D. Nicol, Heather L. Hanson, Michael J. Borsch, Arthur M. Ryan, Chandrakant Pandya
Life of this patent
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AssigneeGlobalfoundries Inc.
InventorsMichael L. Choate, Mark D. Nicol, Heather L. Hanson, Michael J. Borsch, Arthur M. Ryan, Chandrakant Pandya
Estimating the term…
A system and method for testing a processor. The system includes a gold processor and a test processor, wherein the test processor is the device under test (DUT). The test processor and the gold processor are identical. A first memory is coupled to the gold processor by a first memory bus and a second memory, independent of the first, is coupled to the test processor by a second memory bus. The first and second memories are identical. A memory bus comparator coupled to the first and second memory buses compares memory bus signals generated by the gold and test processors, and selectively provide a first indication if a mismatch occurs. A peripheral bus comparator is also coupled to the gold and test processors, and compares downstream transactions generated by the gold and test processors and to provide a second indication if a peripheral bus comparison results in a mismatch.
A system for testing a processor, the system comprising:
A method for testing a processor, the method comprising:
Dependencies are inferred from the claim text.