Tester input/output sharing
AssigneeTeradyne, Inc.
InventorsArash Behziz, Grady Borders
Life of this patent
Estimating the term…
Abstract
In one implementation, a method of testing multiple DUTs using a single tester channel is provided which includes providing an input signal with the single tester channel simultaneously to each of the DUTs. The method further includes providing a clock signal to each of the DUTs. The clock signal provided to each of the DUTs may be successively delayed clock signals, which are provided to successive DUTs. The method includes using the clock signal to cause a next DUTs to provide an output transition before an output of a prior DUT is returned to a pre-transition state. The method further includes detecting with the single tester channel the output transition of each of the DUTs in response to the input signal and the clock signal.
Claims36
A method of testing in an automated tester, the method comprising:
- testing a plurality of devices under test using a single tester channel comprising:
- providing an input signal simultaneously to each of the plurality of devices under test using the single tester channel;
- providing successively delayed clock signals to successive devices under test;
- detecting with the single tester channel a cumulative output from the plurality of devices under test using the single tester channel;
- and
- based on the cumulative output determining, for each of the plurality of devices under test, a response of the device under test to the input signal.
An automated tester comprising:
- a) a test channel comprising a bi-directional input and output circuit;
- b) a series to parallel circuit configured so as to be capable of connecting the bi-directional input and output circuit to a plurality of devices under test;
- c) a plurality of clock circuits each configured so as to be capable of being connected to a respective one of the plurality of devices under test;
- and
- d) wherein the tester is configured to perform bi-directional testing of the plurality of devices under test with the test channel by:
- providing an input signal with the test channel simultaneously to each of a plurality of devices under test;
- causing a next device under test to provide an output transition before an output of a prior device under test is returned to a pre-transition state using successively delayed clock signals provided to successive devices under test;
- measuring a cumulative response output of the plurality of devices under test;
- and
- based on the cumulative response output, for each of the plurality of devices under test, determining a response of the device under test to the input signal.
A method of testing in an automated tester, the method comprising:
- testing a plurality of devices under test using a single tester channel comprising:
- providing an input signal with the single tester channel simultaneously to each of a plurality of devices under test;
- providing a clock signal to each of the plurality of devices under test;
- using the clock signal to cause a next device under test to provide an output transition before an output of a prior device under test is returned to a pre-transition state;
- and
- detecting with the single tester channel a cumulative response output representing the output transition of each of the plurality of devices under test in response to the input signal and the clock signal.
An automated tester comprising:
- a) a test channel comprising a bi-directional input and output circuit;
- b) a series to parallel circuit configured so as to be capable of connecting the bi-directional input and output circuit to a plurality of devices under test;
- c) a plurality of clock circuits each configured so as to be capable of being connected to a respective one of the plurality of devices under test;
- and
- d) the tester being configured to perform bi-directional testing of the plurality of devices under test with the test channel by:
- providing an input signal with the test channel simultaneously to each of a plurality of devices under test;
- causing a next device under test to provide an output transition before an output of a prior device under test is returned to a pre-transition state;
- and
- detecting with the test channel a cumulative response signal comprising the output transition of each of the plurality of devices under test in response to the input signal and the clock signal.
Dependencies are inferred from the claim text.