Malfunction detection system and integrated circuit
AssigneePanasonic Corporation
InventorsEiichi Sadayuki, Tatsumi Sumi
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AssigneePanasonic Corporation
InventorsEiichi Sadayuki, Tatsumi Sumi
Estimating the term…
The present invention is applicable to various sensor outputs including pulse signals and reduces cost for detecting malfunction. The malfunction detection system detects a malfunction in a sensor, and the malfunction detection system includes a sensor including a first terminal, and which outputs a sensor output current that varies a voltage level of the first terminal, a current output unit which varies the voltage level of the first terminal by outputting a constant current for judging to the sensor via the first terminal, and a judging unit which judges that the sensor is malfunctioning when the current for judging causes the voltage level of the first terminal to be equal to or higher than a threshold in a period different from a first period where the sensor output current causes the voltage level of the first terminal to be equal to or higher than the threshold.
A malfunction detection system which detects a malfunction in a sensor, said malfunction detection system comprising:
A malfunction detection method for detecting a malfunction in a sensor, said malfunction detection method comprising:
An integrated circuit which detects a malfunction in a sensor, said malfunction detection system comprising:
Dependencies are inferred from the claim text.