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US 7,888,960 B2Granted
Method of testing a power supply controller and structure therefor
AssigneeSemiconductor Components Industries, LLC
InventorPaolo Migliavacca
Life of this patent
Estimating the term…
Abstract
In one embodiment, a power supply controller is configured to operate in a test mode that facilitates measuring the value of an output signal of an error amplifier of the power supply controller.
Claims10
A method of testing a power supply controller comprising:
- coupling an output signal from an output of an error amplifier of the power supply controller to an impedance translator including coupling the output signal from the output of the error amplifier to a feedback circuit of the power supply controller;
- and
- measuring a value of an output signal of the impedance translator.
A method of testing a power supply controller comprising:
- coupling an output signal from an output of an error amplifier of the power supply controller to an impedance translator including translating the output signal from a high output impedance of the error amplifier to a low output impedance of the impedance translator;
- and
- measuring a value of an output signal of the impedance translator.
A power supply controller comprising:
- an error amplifier having a first input, a second input, and an output;
- and
- a test mode controller configured to couple the first input of the error amplifier to receive a signal representative of an output signal of the error amplifier, the test mode controller including an impedance translator wherein the test mode controller is configured to couple the output signal of the error amplifier to an input of the impedance translator and to couple an output signal of the impedance translator to the first input of the error amplifier in a test mode and to not couple the output signal of the error amplifier through the impedance translator to the first input of the error amplifier in the normal mode.
Dependencies are inferred from the claim text.