Apparatus for testing a semiconductor device and a method of fabricating and using the same

An apparatus for testing a semiconductor device, the apparatus comprising:

• at least one cable penetrating a substrate and extending from a surface of the substrate, the at least one cable including at least one signal line and at least one ground line;
• a pair of probes connected to the at least one signal line, the pair of probes including a first probe configured to contact a first pad of a semiconductor device and a second probe configured to contact a second pad of the semiconductor device;
• and
• a control unit on the surface of the substrate configured to control a distance between the pair of probes, wherein the at least one signal line includes a first signal line and a second signal line, the at least one ground line covers the signal lines, and the first probe is connected to the first signal line and the second probe is connected to the second signal line.

An apparatus for testing a semiconductor device, the apparatus comprising:

• at least one cable penetrating a substrate and extending from a surface of the substrate, the at least one cable including at least one signal line and at least one ground line;
• a pair of probes connected to the at least one signal line, the pair of probes including a first probe configured to contact a first pad of a semiconductor device and a second probe configured to contact a second pad of the semiconductor device;
• and
• a control unit on the surface of the substrate configured to control a distance between the pair of probes, wherein the at least one cable includes a first cable and a second cable, the at least one signal line includes a first signal line in the first cable and a second signal line in the second cable, and the at least one ground line includes a first ground line in the first cable and a second ground line in the second cable, and the first probe is attached to the first signal line and the second probe is attached to the second signal line.