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US 7,888,955 B2Granted
Method and apparatus for testing devices using serially controlled resources
AssigneeFormFactor, Inc.
InventorTommie Edward Berry
Life of this patent
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Abstract
Methods and apparatus for testing devices using serially controlled resources have been described. Examples of the invention can relate to an apparatus for testing a device under test (DUT). In some examples, an apparatus can include an integrated circuit (IC) having a serialized input coupled to test circuits, the test circuits selectively communicating test signals with the DUT responsive to a test control signal on the serialized input.
Claims18
An apparatus for testing a device under test (DUT), comprising:
- an integrated circuit (IC) having a serialized input coupled to test circuits, the test circuits selectively communicating test signals with the DUT responsive to a test control signal on the serialized input,
- wherein the test circuits comprise:
- a shift register, coupled to the serialized input, configured to store bits of the test control signal;
- and
- test resources, coupled to the shift register, configured to provide at least one of a source or a sink of the test signals responsive to the bits.
2 more elements
A probe card assembly, comprising:
- at least one serial control line providing a respective at least one test control signal;
- and
- a plurality of integrated circuits (ICs) serially coupled to form a chain, the chain coupled to the at least one serial control line, the plurality of ICs selectively communicating test signals between test resources and test probes responsive to the at least one test control signal,
- wherein each of the plurality of ICs comprises:
- at least one control group, each including:
- a shift register configured to store bits of a test control signal of the at least one test control signal;
- and
- a plurality of the test resources, coupled to the shift register, configured to provide at least one of a source or a sink of a plurality of the test signals responsive to the bits.
5 more elements
Dependencies are inferred from the claim text.