Method of utilizing an interposer in an automated test system and an automated test system having an interposer

A method of utilizing an interposer in an automated test system, the method comprising:

• determining whether a configuration of conductive elements of a device under test board is to be converted to match a configuration of conductive elements of devices under test;
• engaging the interposer to the device under test board in response to an affirmative determination;
• utilizing a first surface of the interposer to match the configuration of conductive elements of the device under test board;
• and
• utilizing a second surface of the interposer to match the configuration of conductive elements of the devices under test, wherein the configuration of conductive elements of the device under test board is different than the configuration of conductive elements of the devices under test and conductive columns and corresponding conductive pads of the interposer adapt the device under test board for use with the devices under test.

An automated test system, comprising:

• a device tester adapted to automatically characterize electrical characteristics of devices under test;
• a device handler adapted to present the devices under test to the device tester for automatic characterization, the device handler including an interface adapted to accept a device under test board;
• and
• an interposer coupled to the interface of the device handler, the interposer being adapted to convert a configuration of conductive elements of the device under test board to be compatible with a configuration of conductive elements of the device handler, wherein the configuration of conductive elements of the device under test board is different than the configuration of conductive elements of the device handler.