Surface emitting laser and manufacturing method therefor
AssigneeCanon Kabushiki Kaisha
InventorMitsuhiro Ikuta
Life of this patent
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Abstract
Provided is a surface emitting laser or the like capable of suppressing horizontal misalignment between the surface relief structure and the current confining structure to make higher the precision of the alignment, to thereby obtain single transverse mode characteristics with stability. The surface emitting laser having a semiconductor layer laminated therein includes: a first etching region formed by etching a part of the upper mirror; and a second etching region formed by performing etching from a bottom portion of the first etching region to a semiconductor layer for forming a current confining structure, in which a depth of the second etching region is smaller than a depth of the first etching region.
Claims5
A method of manufacturing a surface emitting laser comprising:
- laminating a semiconductor layer on a substrate, the semiconductor layer including a lower mirror, an active layer, and an upper mirror;
- forming a first etching region by etching a part of the upper mirror from an upper portion of the upper mirror;
- forming a resist on the upper mirror following the forming the first etching region;
- patterning the resist to form a pattern for forming a surface relief structure by a stepped structure and for forming a second etching region as one step;
- forming the second etching region, following the patterning, using the pattern, from a bottom portion of the first etching region to a semiconductor layer for forming a current confining structure, the semiconductor layer being provided one of in the upper mirror and between the upper mirror and the active layer, below the first etching region;
- forming the current confining structure by oxidizing, from the second etching region, a part of the semiconductor layer for forming the current confining structure;
- and
- forming, in a light emitting portion on a front surface side of the upper mirror, the surface relief structure by the stepped structure by etching, following the patterning, using the pattern, a part of the upper mirror,
- wherein the second etching region is smaller in depth than the first etching region.
Dependencies are inferred from the claim text.