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US 7,883,020 B2Granted
Smart card and method of testing smart card
AssigneeSamsung Electronics Co., Ltd.
InventorSeung-Won Lee
Life of this patent
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Abstract
A smart card includes a non-volatile memory, a CPU, and a plurality of pads. The non-volatile memory stores a test program. The CPU is released from a reset state in response to a test enable signal. The CPU executes the test program stored in the non-volatile memory based on predetermined flag information and stores a result of the test program in the non-volatile memory.
Claims5
A smart card comprising:
- a non-volatile memory storing a test program;
- a CPU (central processing unit);
- and
- a clock generator configured to generate a clock signal for driving the CPU in response to a power supply voltage that powers the smart card,
- wherein the CPU is released from a reset state in response to the power supply voltage, the CPU executes the test program stored in the non-volatile memory based on predetermined flag information and the clock signal, and the CPU stores a result of the test program in the non-volatile memory.
2 more elements
Dependencies are inferred from the claim text.