Alignment adjusting mechanism and measuring instrument
AssigneeMitutoyo Corporation
InventorsTakeshi Kawabata, Takeshi Yamamoto
Life of this patent
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AssigneeMitutoyo Corporation
InventorsTakeshi Kawabata, Takeshi Yamamoto
Estimating the term…
An alignment mechanism includes: an adjusting plate having first and second adjustment ends parallel to an X axis direction; a probe fixing portion provided to the adjusting plate; a probe fixed to the probe fixing portion; a reinforcing plate having first and second base ends parallel to the X axis direction, displacement of the reinforcing portion in a Y axis direction being restricted; Y-direction adjusting screws for pressing the adjusting plate in the Y axis direction; and adjustment connectors for respectively connecting the first adjustment end with the first base end and the second adjustment end with the second base end. A stylus of the probe is disposed on a line of intersection of a first inclined surface including the first adjustment end and the first base end and a second inclined surface including the second adjustment end and the second base end.
An alignment adjusting mechanism, comprising:
A measuring instrument, comprising:
Dependencies are inferred from the claim text.