Charged particle beam irradiation system
AssigneeHitachi, Ltd.
InventorsKunio Moriyama, Takahide Nakayama, Hideaki Nishiuchi
Life of this patent
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Abstract
A charged particle beam irradiation system comprises a high-speed steerer (beam dump device) 100 disposed in a course of a beam transport line 4 through which an ion beam is extracted from a charged-particle beam generator 1. The beam dump device 100 is provided with dose monitoring devices 105, 106 for measuring a dose of an ion beam applied to a beam dump 104 so that the intensity of the ion beam can be measured without transporting the ion beam to irradiation nozzles 15A through 15D. Thus, the system is capable of adjusting the intensity of an ion beam extracted from a synchrotron without operating each component of a beam transport line, and an irradiation nozzle.
Claims9
A charged particle beam irradiation system comprising:
- a charged particle beam generator for accelerating and extracting a charged particle beam;
- a beam transport line for transporting the charged particle beam extracted from the charged particle beam generator, said beam transport line being connected to the charged particle beam generator;
- and
- at least one irradiation nozzle for irradiating an affected part of a patient with the charged particle beam;
- wherein
- said charged particle beam irradiation system further comprises:
- a beam dump device including:
- a steering magnet that is disposed on the beam transport line;
- and a beam dump that is disposed on a beam path branching from the steering magnet, said beam dump device performing the excitation control of the steering magnet such that from among charged particle beams extracted from the charged particle beam generator, a charged particle beam which is not to be transported to the irradiation nozzle is applied to the beam dump;
- and
- a dose monitoring device disposed in the beam dump device for measuring the dose of the charged particle beam applied to the beam dump.
Dependencies are inferred from the claim text.