Probe for scanning over a substrate and a data storage device
AssigneeInternational Business Machines Corporation
InventorsGerd Binnig, Evangelos Elefheriou, Mark Lantz
Life of this patent
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Abstract
A method of scanning over a substrate includes implementing a write mode of the substrate by scanning a probe across a substrate, the probe having a spring cantilever probe mechanically fixed to a probe holding structure, a tip with a nanoscale apex, and an actuator for lateral positioning of the tip; the actuator comprising a thermally switchable element and a heating element for heating the thermally switchable element; and heating the heating element to a given temperature so as to locally soften a portion of the substrate and applying a force to the softened portion of the substrate through the tip so as to create one or more indentation marks in the softened portion of the substrate.
Claims14
A method of scanning over a substrate, the method comprising:
- implementing a write mode of the substrate by scanning a probe across a substrate, the probe having a spring cantilever with first, second and third legs mechanically fixed to a probe holding structure, a tip with a nanoscale apex extending from the second leg, a first heating element in contact with the tip, and an actuator for lateral positioning of the tip;
- the actuator comprising a thermally switchable element and a second heating element for heating the thermally switchable element;
- and
- heating the first heating element to a given temperature so as to locally soften a portion of the substrate and applying a force to the softened portion of the substrate through the tip so as to create one or more indentation marks in the softened portion of the substrate.
A method of scanning over a substrate, the method comprising:
- laterally positioning a probe across a substrate from a first position to a second position, the probe having a spring cantilever mechanically fixed to a probe holding structure, a tip with a nanoscale apex extending from the cantilever, an actuator for lateral positioning of the tip, and a bridge configuration disposed between the cantilever and a nose of the probe holding structure;
- wherein the actuator comprises a first bridge of the bridge configuration, and includes a thermally switchable element and a first heating element for heating the thermally switchable element.
Dependencies are inferred from the claim text.