Mechanism for detection and compensation of NBTI induced threshold degradation

A design structure embodied in a non-transitory machine readable medium used in a design process, the design structure comprising a semiconductor device, comprising:

• at least one stress device;
• a voltage source connected to a gate node of said at least one stress device;
• at least one reference device comprising a zero gate-to-source voltage;
• and
• a controller connected to said stress device and to said reference device, wherein said controller is adapted to:
• configure node voltages of at least one of said at least one stress device and said at least one reference device to reflect different regions of device operations;
• measure a difference in current between said at least one stress device and said at least one reference device to determine whether negative bias temperature instability (NBTI) induced threshold degradation has occurred in said at least one stress device;
• and
• adjust an output power supply voltage of said at least one stress device until a performance of said at least one stress device matches a performance of said at least one reference device to account for said NBTI induced threshold degradation.