Systems, devices, and methods for controlling electrical and optical properties of transparent conductors
AssigneeCambrios Technologies Corporation
InventorsJeffrey Wolk, Haixia Dai, Xina Quan, Michael A. Spaid
Life of this patent
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Abstract
Systems, devices, and methods for designing and/or manufacturing transparent conductors. A system is operable to evaluate optical and electrical manufacturing criteria for a transparent conductor. The system includes a database including stored reference transparent conductor data, and a controller subsystem configured to compare input acceptance manufacturing criteria for a transparent conductor to stored reference transparent conductor data.
Claims25
A method for controlling a process of fabricating a transparent conductor film having nanowires, the method comprising:
- receiving, by a processor, an input specification of a physical characteristic of the transparent conductor film;
- comparing, by the processor, the input specification to stored reference data correlating a physical characteristic of reference transparent conductor films to a physical characteristic of reference nanowires;
- generating a manufacturing specification that correlates a target physical characteristic of the nanowires to the input specification;
- and
- controlling a physical characteristic of the nanowires of the transparent conductor film based on the manufacturing specification.
A non-transitory computer readable storage medium comprising instructions that, when executed on a computer, execute a method for designing a nanowire transparent conductor, the method comprising:
- determining sets of nanowire values based on information indicative of a desired electrical or optical property of the nanowire transparent conductor, the sets comprising a nanowire length, a nanowire width or diameter, and a corresponding density;
- and
- generating a manufacturing specification based on the determined sets of nanowire values for manufacturing the transparent conductor.
A system for evaluating optical and electrical manufacturing criteria for a transparent conductor, comprising:
- a database comprising stored reference transparent conductor data, the stored reference transparent conductor data comprising data correlating a nanowire length, a nanowire diameter, a nanowire density, or a nanowire concentration to electrical or optical properties of a transparent conductor film;
- and
- a controller subsystem configured to compare input acceptance manufacturing criteria for a transparent conductor to the stored reference transparent conductor data, and to generate a response based on the comparison;
- wherein the inputted acceptance manufacturing criteria comprises at least one of a sheet resistance level, an optical density level, a transmission, or a haze level.
A method for designing a nanowire transparent conductor, the method comprising:
- automatically determining sets of nanowire values based on information indicative of a desired electrical or optical property of the nanowire transparent conductor, the sets comprising a nanowire length, a nanowire width or diameter, and a corresponding density;
- and
- automatically generating, by a processor, a manufacturing specification based on the determined sets of nanowire values for manufacturing the transparent conductor.
Dependencies are inferred from the claim text.