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US 7,849,374 B1Granted
Testing a transceiver
AssigneeLTX Corporation
InventorsR. Warren Necoechea, Timothy Burnett, Fengming Zhang, Harry Hou
Life of this patent
Estimating the term…
Abstract
A filter includes at least a pin diode, an inductive element, and a varactor diode coupled as a resonant circuit. The filter injects data dependent jitter into a digital data signal with a given data rate for testing a transceiver.
Claims19
An apparatus comprising:
- a low pass differential filter to inject Inter Symbol Interference (“ISI”) into a digital data signal with a given data rate, wherein the low pass filter includes
- a first pin diode,
- a second pin diode,
- a first inductive element coupled to the first in diode,
- a second inductive element coupled to the second pin diode, and
- a pair of varactor diodes, wherein the varactor diodes are coupled between the first and second pin diodes and the first and second pin diodes are coupled between the first and second inductive elements.
3 more elements
An apparatus, comprising:
- a multi-stage variable low pass filter to inject Inter Symbol Interference (ISI) into a digital data Signal with a given data rate, wherein the low pass filter includes
- a first pin diode,
- a second pin diode,
- a first inductive element coupled to the first in diode,
- a second inductive element coupled to the second pin diode, and
- a pair of varactor diodes, wherein the varactor diodes are coupled between the first and second pin diodes and the first and second pin diodes are coupled between the first and second inductive elements.
3 more elements
A method comprising:
- using a filter to inject data dependent jitter into a digital data signal with a given data rate, the a low pass differential filter comprising
- a first pin diode,
- a second pin diode,
- a first inductive element coupled to the first pin diode,
- a second inductive element coupled to the second pin diode, and
- a pair of varactor diodes, wherein the varactor diodes are coupled between the first and second pin diodes and the first and second pin diodes are coupled between the first and second inductive elements.
3 more elements
Dependencies are inferred from the claim text.