Time lag measuring device, distance measuring apparatus and distance measuring method
AssigneeTopcon Corporation
InventorsMasahiro Ohishi, Yoshikatsu Tokuda, Fumio Ohtomo
Life of this patent
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AssigneeTopcon Corporation
InventorsMasahiro Ohishi, Yoshikatsu Tokuda, Fumio Ohtomo
Estimating the term…
In measuring a certain time lag between generations of two pulse signals, a time lag measuring device prevents errors in measurement results even with an error in two reference signals for measuring the time lag. The device measures a time lag between a start signal M1 and a stop signal M2 and includes a reference signal generating section 41 generating two reference signals S1, S2 having a phase difference π/2, and an amplitude detecting section 42 detects amplitudes A11, A12 and A21, A22 of the reference signals S1, S2 at generation timings for the start signal M1 and the stop signal M2, a phase difference detecting section 43 calculating a phase _ of the reference signals S according to each set of the amplitudes (A11, A12) and (A21, A22), and a correcting section 46 correcting the calculated phase using correction data for error correction in the reference signals S1, S2.
A time lag measuring device for measuring an unknown time lag between generations of two pulse signals, comprising:
A time lag measuring device for measuring an unknown time lag between generations of two pulse signals, comprising:
A time lag measuring device for measuring an unknown time lag between generations of two pulse signals, comprising:
A distance measuring method comprising the steps of:
A distance measuring method comprising the steps of:
Dependencies are inferred from the claim text.