Methods and apparatus to test electronic devices
AssigneeTexas Instruments Incorporated
InventorsAbidur Rahman, Chris Vogel
Life of this patent
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Abstract
Methods and apparatus to test electronic devices are disclosed. An example method includes setting a first controlled switch to prevent a current detect signal from tripping an overcurrent protection event controlling an operation of the device; setting a second controlled switch to route a first sensed voltage associated with the device to a voltage adjuster; sending a calibration current corresponding to a target threshold current through the device; detecting the first sensed voltage while the calibration current flows through the device; and setting a reference signal substantially equal to the first sensed voltage, wherein the reference signal is to be used to generate the current detect signal.
Claims20
A method of testing a device, comprising:
- setting a first controlled switch to prevent a current detect signal from tripping an overcurrent protection event controlling an operation of the device;
- setting a second controlled switch to route a first sensed voltage associated with the device to a voltage adjuster;
- sending a calibration current corresponding to a target threshold current through the device;
- detecting the first sensed voltage while the calibration current flows through the device;
- and
- setting a reference signal substantially equal to the first sensed voltage, wherein the reference signal is to be used to generate the current detect signal.
An apparatus to test a field-effect transistor (FET), comprising:
- a FET controller to receive a current detect signal from a comparator, the FET controller to turn off the FET when the current detect signal indicates an overcurrent condition;
- a first controlled switch coupled to the comparator and the FET controller, the first controlled switch to prevent the current detect signal from reaching the FET controller;
- a current source coupled to the FET to send a calibration current corresponding to a target threshold current through the FET;
- a resistor coupled to a sense FET mirroring the FET, the resistor to detect a first voltage associated with the FET while the calibration current flows through the FET;
- and
- a voltage adjuster to set a reference voltage substantially equal to the first voltage, the comparator to receive the reference voltage to be used to generate the current detect signal.
A method of testing a field-effect transistor (FET), comprising:
- setting a first controlled switch to prevent a current detect signal from reaching a FET controller, the FET controller to turn off the FET when the current detect signal indicates an overcurrent condition;
- setting a second controlled switch to route a first voltage associated with the FET to a voltage adjuster;
- sending a calibration current corresponding to a target threshold current through the FET;
- measuring the first voltage while the calibration current flows through the FET;
- measuring a second voltage associated with the FET while the calibration current flows through the FET;
- removing the calibration current from the FET after the first and second voltages are measured;
- calculating an on-resistance of the FET using the second voltage;
- and
- setting a reference voltage substantially equal to the first voltage, the reference voltage to be used to generate the current detect signal.
Dependencies are inferred from the claim text.