Gallium nitride baseplate and epitaxial substrate
AssigneeSumitomo Electric Industries, Ltd.
InventorsAkinori Koukitu, Yoshinao Kumagai, Yoshiki Miura, Kikurou Takemoto, Fumitaka Sato
Life of this patent
Estimating the term…
Loading patent…
AssigneeSumitomo Electric Industries, Ltd.
InventorsAkinori Koukitu, Yoshinao Kumagai, Yoshiki Miura, Kikurou Takemoto, Fumitaka Sato
Estimating the term…
A method of forming an iron-doped gallium nitride for a semi-insulating GaN substrate is provided. A substrate (1), such as a (0001)-cut sapphire substrate, is placed on a susceptor of a metalorganic hydrogen chloride vapor phase apparatus (11). Next, gaseous iron compound GFe from a source (13) for an iron compound, such as ferrocene, and hydrogen chloride gas G1HCl from a hydrogen chloride source (15) are caused to react with each other in a mixing container (16) to generate gas GFeComp of an iron-containing reaction product, such as iron chloride (FeCl2). In association with the generation, the iron-containing reaction product GFeComp, first substance gas GN containing elemental nitrogen from a nitrogen source (17), and second substance gas GGa containing elemental gallium are supplied to a reaction tube (21) to form iron-doped gallium nitride (23) on the substrate (1).
A semi-insulating gallium nitride baseplate having an iron concentration of 5×1016 cm31 3 or more, a thickness of 100 micrometers or more, a resistivity of 1×107 Ω·cm or more, and an n-type carrier concentration of not greater than approximately 1.6×1016 cm−3.
Dependencies are inferred from the claim text.