Semiconductor device and method for fabricating the same
AssigneeHynix Semiconductor Inc.
InventorsChang Youn Hwang, Hyun Ahn
Life of this patent
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Abstract
A method for fabricating a semiconductor device includes forming a recess gate over a semiconductor substrate. A gate spacer is formed on a sidewall of the recess gate. The semiconductor substrate in a landing plug contact region is soft-etched to form a recess having a rounded profile. A sidewall spacer is formed over the gate spacer and a sidewall of the recess. An insulating film is formed over the semiconductor substrate. The insulating film is selectively etched to form a landing plug contact hole. A conductive layer in the landing plug contact hole is filled to form a landing plug.
Claims13
A method for fabricating a semiconductor device, the method comprising the steps of:
- forming a recess gate having sidewalls over a semiconductor substrate defining a landing plug contact region;
- forming a gate spacer on a sidewall of the recess gate;
- soft-etching the semiconductor substrate in the landing plug contact region to form a recess having a rounded bottom and a sidewall;
- forming a sidewall spacer only over the gate spacer and the sidewall of the recess, wherein the sidewall spacer is thicker than the gate spacer;
- forming an insulating film over the semiconductor substrate including the recess gate, the recess gate spacer, and the recess;
- performing a planarization process on the insulating film to expose the recess gate;
- selectively etching the insulating film to form a landing plug contact hole;
- and
- filling the landing plug contact hole with a conductive layer to form a landing plug.
Dependencies are inferred from the claim text.