Rinsing method, developing method, developing system and computer-read storage medium
AssigneeTokyo Electron Limited
InventorsHirofumi Takeguchi, Junji Nakamura, Kousuke Yoshihara
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AssigneeTokyo Electron Limited
InventorsHirofumi Takeguchi, Junji Nakamura, Kousuke Yoshihara
Estimating the term…
The present invention provides a rinsing method capable of satisfactorily rinsing the surface of a resist film regardless of the condition of the surface of the resist film so that development defects caused by residuals produced by development may be reduced. A rinsing method of rinsing a substrate processed by a developing process for developing an exposed pattern comprises the steps of discharging a rinsing liquid onto a central part of the substrate processed by the developing process and coated with a developer puddle while the substrate is stopped or rotated (step 5), stopping discharging the rinsing liquid in a state where the developer puddle remains at least in a peripheral part of the substrate (step 6), and rotating the substrate at a high rotating speed to shake the developer remaining on the substrate off the substrate together with the rinsing liquid (step 7).
A rinsing method of rinsing a substrate processed by a developing process that forms a developer puddle on a resist film formed on the substrate and having an exposed pattern, said rinsing method comprising the steps of:
Dependencies are inferred from the claim text.