US 7,841,770 B2 · Temperature measuring system and measuring method using the same

Abstract

A temperature measuring system and a measuring method using the same are disclosed. The method for measuring an integrated circuit temperature includes the steps of: detecting a first difference in output voltage values between a first transistor and a second transistor by providing a first current through the first transistor and a second current through the second transistor; detecting a second difference in output voltage values between the first transistor and the second transistor by providing the second current through the first transistor and the first current through the second transistor; obtaining an average value by averaging the first difference and the second difference; and determining the temperature by multiplying the average value with a predetermined value.

Claims17

Dependent claims

A method for measuring an integrated circuit temperature T, comprising the steps of:

detecting a first difference in output voltage values (ΔV1) between a first transistor and a second transistor by providing a first current through said first transistor and a second current through said second transistor;
detecting a second difference in output voltage values (ΔV2) between said first transistor and said second transistor by providing said second current through said first transistor and said first current through said second transistor;
obtaining an average value (Vavg) by averaging said first difference ΔV1 and said second difference ΔV2;
and
determining said temperature T by multiplying said average value Vavg with a default value M.

2 more elements

A temperature measuring system for measuring a temperature T of an integrated circuit, comprising:

a first transistor coupled to said integrated circuit having a first output voltage while a first current is provided therethrough and a second output voltage while a second current is provided therethrough;
a second transistor coupled to said integrated circuit having a third output voltage while said first current is provided therethrough and a fourth output voltage while said second current is provided therethrough;
a comparator for calculating a first difference (ΔV1) between said first output voltage and said fourth output voltage, and calculating a second difference (ΔV2) between said second output voltage and said third output voltage;
and
a processor for obtaining an average value (Vavg) by averaging said first difference ΔV1 and second difference ΔV2, and determining said temperature T of said integrated circuit by multiplying said average value Vavg with a default value M.

2 more elements

Dependencies are inferred from the claim text.

Temperature measuring system and measuring method using the same

Life of this patent

Temperature measuring system and measuring method using the same

Life of this patent

Abstract

Claims17