Measurement apparatus
AssigneesHong Fu Jin Precision Industry Co., Ltd., Hon Hai Precision Industry Co., Ltd.
InventorsShi-Xin Xiao, Chung-Yuan Chen, Long-Fong Chen
Life of this patent
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Abstract
A measurement apparatus for measuring a distance between a base surface and an upper surface of a stepped structure of a workpiece. The measurement apparatus includes a supporting member having an upper surface for supporting the workpiece, a holding member fixed on the top surface, and a micrometer. The holding member includes a reference platform and a depression formed on the reference platform and facing the upper surface. The micrometer is fixed to the holding member and includes an extendable measuring shaft with a contacting portion extending out of the reference platform. The distance is measured by pushing the workpiece into the depression until the base surface make contact with the reference platform.
Claims7
A measurement apparatus for measuring a distance between a base surface and an upper surface of a stepped structure of a workpiece, the measurement apparatus comprising:
- a supporting member comprising a top surface for supporting the workpiece;
- a holding member fixed on the top surface, the holding member comprising a reference platform and a depression formed in the reference platform and facing the upper surface;
- and
- a micrometer fixed on the holding member comprising an extendable measuring shaft with a contacting portion extending out of the reference platform;
- wherein the extendable measuring shaft is pushed by the workpiece until the reference platform contacts the base surface.
A measurement apparatus comprising:
- a supporting member comprising a top surface;
- a holding member fixed on the top surface, comprising a reference platform and a depression formed on the reference platform;
- a micrometer fixed on the holding member comprising an extendable measuring shaft with a contacting portion extending out of the reference platform.
Dependencies are inferred from the claim text.