Apparatus and method of application and development
AssigneeTokyo Electron Limited
InventorsNobuaki Matsuoka, Shinichi Hayashi, Yasushi Hayashida, Yoshitaka Hara
Life of this patent
Estimating the term…
Abstract
Disclosed herein is a development apparatus having a plurality of coating units and a development process unit stacked on each other in a layered direction in a process block which is connected at the rear side of the carrier block. A first transportation unit, which ascends and descends in the layered direction, is provided in the carrier block. Also, in the carrier block, the bottom of a substrate inspection unit is located above a highest position to which the first transportation unit is able to ascend in the layered direction.
Claims7
An application and development apparatus comprising:
- a carrier block,
- a process block connected at a rear side of said carrier block,
- an interface block connected at the rear side of said process block,
- an exposure apparatus connected at the rear side of said interface block,
- a plurality of coating units provided in said process block and stacked on each other, directed to coating film formation, and
- a development process unit provided in said process block and stacked with respect to said coating units to constitute a layered unit together with said coating units, wherein
- said application and development apparatus is configured to deliver a substrate input to the carrier block by a carrier to the process block via a first transportation unit, form a coating film including a resist film on said substrate at the process block, transport said substrate to the exposure apparatus via the interface block, apply a development process at said process block to said substrate subjected to exposure and returned to said process block via said interface block, and deliver said substrate subjected to development to said carrier block,
- said first transportation unit is provided in said carrier block for use in the carrier block,
- said plurality of coating units and said development process unit are stacked on each other in a layered direction,
- said first transportation unit ascends and descends in said layered direction,
- each of said plurality of coating units comprises a plurality of first processing units including a first solution processing unit to apply a coating solution to said substrate and a first heating unit heating said substrate applied with a coating solution, and a second transportation unit for transporting said substrate between the first processing units, at least one of said coating units including said first solution processing unit for resist solution application, and
- said development process unit comprises a plurality of second processing units including a second heating unit to heat said substrate subjected to exposure and a second solution processing unit to apply a developer on said substrate, and a third transportation unit for transporting said substrate between the second processing units,
- said application and development apparatus further comprising:
- a shelf-type delivery stage group being provided in said process block and including a plurality of delivery stages between said carrier block and said layered unit, each of said plurality of delivery stages arranged for each of said plurality of coating units and said development process unit to deliver said substrate with respect to said second transportation unit or said third transportation unit, said plurality of delivery stages including an inspection port,
- a fourth transportation unit being provided in said process block and ascending and descending between each of said delivery stages in said delivery stage group to deliver said substrate,
- a substrate inspection unit provided in said carrier block, the bottom of said substrate inspection unit being located above a highest position to which said first transportation unit is able to ascend in said layered direction, and
- a fifth transportation unit provided in said carrier block for transporting said substrate between said inspection port and said substrate inspection unit.
Dependencies are inferred from the claim text.