All optical and hybrid reflection switch at a semiconductor/glass interface due to laser beam intersection

A method of changing the amount of reflected light from a beam of light, and measuring the amount of change in said reflected light, said method comprising:

• (a) providing a substrate bearing a film of a reflective material, said reflective material is selected from the group consisting of semiconductive materials;
• (b) directing a first beam of light at a reflecting point upon said reflective material so as to create a reflecting beam therefrom;
• (c) directing a second beam of light at said reflecting point upon said reflective material, said second beam of light being of sufficient energy so as to alter the amount of light in said reflecting beam by electromagnetic interaction with said first beam of light at said reflecting point, said reflective material being supplied with an electrical contact placed on said reflective material so as to be capable of placing a voltage through said reflective material at said reflecting point;
• and
• (d) measuring the amount of change in the amount of light in said reflected beam as a result of said electromagnetic interaction.

An apparatus for changing the amount of reflected light from a beam of light and measuring that change, said apparatus comprising:

• (a) a substrate bearing a film of a reflective material, said reflective material is selected from the group consisting of semiconductive materials;
• (b) a source of a first beam of light directed at a reflecting point upon said reflective material so as to create a reflecting beam therefrom;
• (c) a source of a second beam of light directed at said reflecting point upon said reflective material and of sufficient energy to alter the amount of light in said reflecting beam by electromagnetic interaction with said first beam of light at said reflecting point, said reflective material being supplied with an electrical contact placed on said reflective material so as to be capable of placing a voltage through said reflective material at said reflecting point;
• and
• (d) a measurement device for measuring the measuring the amount of change in said reflected beam.