Systems and methods for predicting maintenance of intelligent electronic devices
AssigneeGeneral Electric Company
InventorsBogdan Z. Kasztenny, Lawrence A. Sollecito, Jeffrey G. Mazereeuw, Zhihong Mao
Life of this patent
Estimating the term…
Abstract
Predictive maintenance systems and methods are described. A method includes measuring environmental conditions using a plurality of sensors within the IED, processing the environmental measurements to determine long-term exposure factors representing historical operating conditions of the IED, applying a reliability model to the long-term exposure factors, determining a numerical measure of IED life based on the long-term exposure factors and the reliability model, comparing the numerical measure of IED life to preselected boundary values, and signaling if the numerical measure of IED life is outside of the preselected boundary values.
Claims30
A method for predicting maintenance of an intelligent electronic device (IED), said method comprising:
- measuring environmental conditions using at least one sensor associated with the IED;
- processing the measured environmental conditions to determine long-term exposure factors, said long-term exposure factors representing conditions of an IED operation;
- applying the determined long-term exposure factors to a reliability model, said reliability model providing a relationship between known exposure factors and characteristics of said IED;
- determining a numerical measure of IED life based on the determined long-term exposure factors and the reliability model;
- comparing the numerical measure of IED life to preselected boundary values;
- and
- providing a signal when the numerical measure of IED life is outside of the preselected boundary values.
A system for establishing and maintaining reliability models for a plurality of intelligent electronic devices (IEDs), said system comprising:
- an acquisition unit configured to acquire long-term exposure factors from the plurality of IEDs;
- an input unit configured to receive failure information from failed IEDs of the plurality of IEDs;
- and
- a processor configured to be coupled to said acquisition unit and said input unit, said processor programmed to:
- obtain a reliability of each IED of the plurality of IEDs;
- and
- derive a reliability model, said reliability model providing a correlation between known exposure factors and the reliability of each IED of the plurality of IEDs.
A system for monitoring operating conditions of an intelligent electronic device (IED) having a plurality of sensors therein for acquiring environmental data among a plurality of IEDs, said system comprising:
- an acquisition unit configured to acquire long-term exposure factors from the plurality of sensors associated with selected ones of the plurality of IEDs;
- an input unit configured to receive failure information from failed IEDs of the plurality of IEDs;
- and
- a processor configured to be coupled to said acquisition unit and said input unit, said processor programmed to:
- obtain a reliability of each of the plurality of IEDs;
- derive a reliability model, said reliability model providing a correlation between known exposure factors and the reliability of each of the plurality of IEDs, said reliability model being further adapted based on said acquired long-term exposure factors and said received failure information;
- determine a numerical measure of IED life of at least one IED based on the acquired sensor information associated with said at least one IED;
- compare the numerical measure of a remaining IED life of said at least one IED to preselected boundary values associated with said IED;
- and
- generate a signal when the numerical measure of the IED life is outside of the preselected boundary values.
Dependencies are inferred from the claim text.