Method and apparatus for extending equipment uptime in ion implantation
AssigneeSemEquip, Inc.
InventorsThomas N. Horsky, Robert W. Milgate, III, George P. Sacco, Jr., Dale C. Jacobson, Wade A. Krull
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AssigneeSemEquip, Inc.
InventorsThomas N. Horsky, Robert W. Milgate, III, George P. Sacco, Jr., Dale C. Jacobson, Wade A. Krull
Estimating the term…
The service lifetime of an ion source is enhanced or prolonged by the source having provisions for in-situ etch cleaning of the ion source and of an extraction electrode, using reactive halogen gases (F or Cl), and by having features that extend the service duration between cleanings. The latter include accurate vapor flow control, accurate focusing of the ion beam optics, and thermal control of the extraction electrode that prevents formation of deposits or prevents electrode destruction. An apparatus comprised of an ion source for generating dopant ions for semiconductor wafer processing is coupled to a remote plasma source which delivers F or Cl ions to the first ion source for the purpose of cleaning deposits in the first ion source and the extraction electrode. These methods and apparatus enable long equipment uptime when running condensable feed gases such as sublimated vapor sources, and are particularly applicable for use with so-called cold ion sources. Methods and apparatus are described which enable long equipment uptime when decaborane and octadecarborane are used as feed materials, as well as when vaporized elemental arsenic and phosphorus are used, and which serve to enhance beam stability during ion implantation.
An ion generating system for generating an ion beam comprising:
An ion generating system for generating an ion beam comprising:
An ion generating system for generating a ion beam comprising:
An ion generating system for generating a ion beam comprising:
A method of producing an ion beam employing an ion implantation system having an ion source and an extraction electrode for extracting ions from the ion source, in which the extraction electrode is associated with an electrical heater, the heater adapted, during ion extraction, to maintain the extraction electrode at elevated temperature above the condensation temperature of gaseous or vaporous material leaving the ion source, the method comprising electrically heating the extraction electrode while extracting ions from the ion source and including the steps of operating the ion source and thereafter discontinuing operation of the ion source and subjecting the extraction electrode surface to cleaning by flow of reactive gas.
Dependencies are inferred from the claim text.