Vertical cavity surface emitting laser module having monitoring photodiode and method of fabricating the same
AssigneeElectronics and Telecommunications Research Institute
InventorsMi Ran Park, O Kyun Kwon
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AssigneeElectronics and Telecommunications Research Institute
InventorsMi Ran Park, O Kyun Kwon
Estimating the term…
Provided are a vertical cavity surface emitting laser (VCSEL) module providing accurate alignment between a VCSEL and a monitoring photodiode (MPD) for efficiently detecting light emitted by the VCSEL and a method of fabricating the VCSEL module. The VCSEL module includes: a first mirror layer, a first semiconductor conducting layer, an active layer, a tunnel junction layer, and a second semiconductor conducting layer sequentially formed on a first region in a substrate having first and second regions; a MPD disposed on a portion of the second semiconductor conducting layer in the first region; and a VCSEL including layers having the same shapes as the first mirror layer, the first semiconductor conducting layer, the active layer, the tunnel junction layer and the second semiconductor conducting layer in the first region, and a second mirror layer formed on a portion of the second semiconductor conducting layer, and sequentially formed on the second region in the substrate. The predetermined distance is set so that light emitted by the VCSEL can be detected by the MPD.
A Vertical Cavity Surface Emitting Laser (VCSEL) module having a monitoring photodiode, the VCSEL module comprising:
A method of fabricating a Vertical Cavity Surface Emitting Laser (VCSEL) module having a monitoring photodiode, the method comprising
Dependencies are inferred from the claim text.
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Out-coupling of light: using windows, e.g. specially adapted for back-reflecting light to a detector inside the housing
Photo-diodes, e.g. transceiver devices, bidirectional devices: for monitoring the laser-output
Electrical excitation ; Circuits therefor: characterised by the semiconducting contacting layers
Characterised by the configuration: having positive and negative electrodes on the same side of the substrate
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This application claims the benefit of Korean Patent Application No. 10-2005-0120082 filed on Dec. 8, 2005 and Korean Patent Application No. 10-2006-0060501 filed on Jun. 30, 2006, in the Korean Intellectual Property Office, the disclosures of which are incorporated herein in their entirety by reference.
1. Field of the Invention
The present invention relates to a semiconductor laser and a method of fabricating the same, and more particularly, to a vertical cavity surface emitting laser (VCSEL) module having a monitoring photodiode (MPD) and a method of fabricating the same.
The above and other features and advantages of the present invention will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings in which:
FIGS. 1A and 1B are cross-sectional views illustrating a method of fabricating a vertical cavity surface emitting laser (VCSEL) device having a monitoring photodiode (MPD) according to an embodiment of the present invention;
FIG. 2 is a plan view illustrating a unit structure for a VCSEL device having a VCSEL monolithically integrated with a MPD according to an embodiment of the present invention; and
The present invention will now be described more fully with reference to the accompanying drawings, in which exemplary embodiments of the invention are shown. The invention may, however, be embodied in many different forms and should not be construed as being limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of the invention to those skilled in the art. Like reference numerals in the drawings denote like elements.
FIGS. 1A and 1B are cross-sectional views illustrating a method of fabricating a vertical cavity surface emitting laser (VCSEL) device 100 having a monitoring photodiode (MPD) according to an embodiment of the present invention.
Referring to FIG. 1A, a first mirror layer 12, a first semiconductor conducting layer 14, an active layer 16, a second semiconductor conducting layer 18, and a tunnel junction layer 20, and another second semiconductor conducting layer 22 are sequentially grown on a substrate 10 using a compound semiconductor epitaxial growth technique. The first and second semiconductor conducting layers 14, 18, and 22 acting as a conducting layer for injecting current may be made of a semiconductor material that dissipates heat due to its excellent thermal characteristics. The tunnel junction layer 20 defines a region into which current is injected by confining current. The active layer 16 is a gain layer that plays an essential role in laser operation. In one embodiment, the substrate 10 and the first mirror layer 12 may be formed of InP and InAlGaAs/InAlAs, respectively. The first and second semiconductor conducting layers 14, 18, and 22 may be formed of n-InP, p-InP, and n-InP, respectively. The active layer 16 may have a multi-quantum well (MQW) structure composed of InAlGaAs. In this manner, an epitaxial structure of the VCSEL device 100 is completed except for a second mirror layer 50 in FIG. 1B that will be subsequently formed.