Scanning examination apparatus
AssigneeOlympus Corporation
InventorsNobuyuki Nagasawa, Masahiro Oba, Tetsuya Koike, Yoshihisa Tanikawa, Yujin Arai
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Abstract
A scanning examination apparatus 1 is provided, the apparatus including a detachable objective lens 6 or 6′, a scanner 3 for two-dimensionally scanning light F from a specimen 100 focused by the objective lens 6 or 6′, a scanner control device 13 for controlling the operation of the scanner 3, and an optical detector 9 for detecting light scanned by the scanner 3, wherein the scanner control device 13 changes the scanning direction of the light F depending on an image formation mode of the light F at the objective lens 6 or 6′ which is attached.
Claims2
A scanning examination apparatus comprising:
- a detachable objective lens;
- a scanner for two-dimensionally scanning light from a specimen focused by the objective lens;
- a scanner control device for controlling the operation of the scanner;
- and
- an optical detector for detecting light scanned by the scanner,
- wherein the scanner control device changes the scanning direction of the light depending on an image formation mode of the light in the objective lens which is attached.
Dependencies are inferred from the claim text.