US 7,804,292 B2Granted

Method for testing integrated circuits mounted on a carrier

AssigneeSilverbrook Research Pty Ltd

InventorsStephen John Sleijpen, William John Stacey, Julian Paul Kolodko, Neil Fyfe Edwards, Neil McAlpin, Eric Patrick O'Donnell, John Robert Sheahan, Jason Mark Thelander

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Abstract

A method for testing integrated circuits mounted on a carrier includes the step of securing the carrier. The carrier is displaced into an operative position in which the integrated circuits are in physical and electrical communication with a diagnostic probe. Test signals are generated in test circuitry in electrical communication with the diagnostic probe and communicated to the integrated circuits with the diagnostic probe. The test signals are received at the test circuitry via the diagnostic probe. The test signals are made available to a controller via a communications link and an automated server and displayed with the controller.

Claims8

Dependent claims

A method for testing a plurality of printhead integrated circuits mounted on a carrier, the method comprising the steps of:

securing the carrier;
displacing the carrier into an operative position for contact with a diagnostic probe such that multiple printhead integrated circuits are in electrical communication with the diagnostic probe;
generating diagnostic printhead test signals in test circuitry at least in electrical communication with the diagnostic probe and communicating the printhead test signals to the printhead integrated circuits via the diagnostic probe;
receiving the printhead test signals at the test circuitry via the diagnostic probe;
making the received printhead test signals available to a controller via a communications link and an automated server;
and
displaying a test status with the controller.

4 more elements

Dependencies are inferred from the claim text.