Semiconductor device including a coupled dielectric layer and metal layer, method of fabrication thereof, and passivating coupling material comprising multiple organic components for use in a semiconductor device
AssigneeFreescale Semiconductor, Inc.
InventorsJanos Farkas, Maria Luisa Calvo-Munoz, Srdjan Kordic
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Abstract
A material for passivating a dielectric layer in a semiconductor device has a molecular structure permitting or at least promoting liquid phase metal deposition thereon in a subsequent process step. The contemplated material may be constituted by multiple organic components. A semiconductor device including a layer of the passivating coupling material, and a method of manufacturing such a semiconductor device are also contemplated.
Claims20
A passivating coupling material for passivating a dielectric material and for facilitating metal deposition on such a passivated dielectric material, wherein the passivating coupling material comprises:
- a first organosilane having the general formula:
- in which:
- n1 is an integer greater than or equal to 1,
- each Si is a silicon atom;
- X1 is a functional group able to react with a surface hydroxyl site of the dielectric material,
- Y1 is either:
- X3, which is a further functional group able to react with a surface hydroxyl site of the dielectric material,
- H, which is a hydrogen atom, or
- R1, which is an organic apolar group;
- Y2 is either:
- X4, which is a further functional group able to react with a surface hydroxyl site of the dielectric material,
- H, which is a hydrogen atom, or
- R2, which is an organic apolar group,
- B1, the presence of which is optional, is a bridging group,
- Z1 is either:
- R3, which is an organic apolar group,
- H, which is a hydrogen atom, or
- X5, which is a hydrolizable functional group,
- Z2 is either:
- R4, which is an organic apolar group,
- H, which is a hydrogen atom, or
- X6, which is a hydrolizable functional group;
- and
- X2 is a hydrolizable functional group;
- and
- a second organosilane having a functional group able to react with a hydrolyzed functional group of the first organosilane, and a ligand for providing a metal nucleation site, the second organosilane having the general formula:
- in which:
- n2 is an integer equal to or greater than or equal to 0,
- each Si is a silicon atom;
- X7 is a functional group able to react with a hydrolyzed functional group of the first organosilane molecule,
- Y3 is either:
- X8, which is a further functional group able to react with a hydrolyzed functional group of the first organosilane molecule,
- H, which is a hydrogen atom, or
- R5, which is an organic apolar group;
- Y4 is either:
- X9, which is a further functional group able to react with a hydrolyzed functional group of the first organosilane molecule,
- H, which is a hydrogen atom, or
- R6, which is an organic apolar group,
- B2, the presence of which is optional, is a bridging group,
- Z3 is either:
- R7, which is an organic apolar group,
- H, which is a hydrogen atom, or
- L1, which is a ligand having an electron donor functionality and which is able to act as a metal nucleation site,
- Z4 is either:
- R8, which is an organic apolar group,
- H, which is a hydrogen atom, or
- L2, which is a ligand having an electron donor functionality and which is able to act as a metal nucleation site, and
- L is a ligand having an electron donor functionality and is able to act as a metal nucleation site,
- wherein the first and second organosilanes together constitute a composition providing metal nucleation sites that promote electroless metal deposition.
Dependencies are inferred from the claim text.