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US 7,803,609 B2Granted
System, method, and product for generating patterned illumination
AssigneeAffymetrix, Inc.
InventorPeter S. Kaplan
Life of this patent
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Abstract
An embodiment of a method for generating an interference pattern at a probe array is described that comprises directing light at a first waveguide and second waveguide, wherein the first and second waveguides are positioned adjacent to each other and the output from the first and second waveguides produce an interference pattern; and directing the interference pattern at the probe array.
Claims20
A method for generating an interference pattern at a probe array, comprising:
- directing light at a first waveguide and second waveguide, wherein the first and second waveguides are positioned adjacent to each other and the output from the first and second waveguides produce an interference pattern;
- and
- directing the interference pattern at the probe array.
A method for generating an interference pattern to interrogate a surface of a support comprising:
- directing light at a first waveguide;
- directing light at a second waveguide,
- wherein the first and second waveguides are positioned in an operative relationship so as to produce an interference pattern;
- and
- directing the interference pattern at a surface of a support;
- and
- detecting signals from the surface of the support.
4 more elements
A system to image the surface of a support comprising:
- a source of excitation light;
- a first waveguide capable of receiving light from the excitation light and transmitting the light out an exit port;
- a second waveguide capable of receiving light from an excitation light and producing an interference pattern when proximately positioned near the first waveguide, the second waveguide is capable of transmitting the light out an exit port;
- a support having a probe array on a surface of a support facing the exit ports of the first and second waveguides;
- a detector capable of receiving reflected signals from the surface of the support;
- and
- a processor for analyzing the detected signals.
4 more elements
Dependencies are inferred from the claim text.