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US 7,800,389 B2Granted
Integrated circuit having built-in self-test features
AssigneeAllegro MicroSystems, LLC
InventorsAndreas P. Friedrich, Andrea Foletto, P. Karl Scheller, Paul David
Life of this patent
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Abstract
An integrated circuit includes a sensor for providing a sensor output signal and a diagnostic circuit coupled to the sensor for providing a self-diagnostic signal. The self-diagnostic signal comprises the sensor output signal during a first time duration and an inverted sensor output signal during a second different time duration.
Claims25
An integrated circuit, comprising:
- a sensor for providing a sensor output signal;
- and
- a diagnostic circuit coupled to the sensor for providing a self-diagnostic signal, wherein the self-diagnostic signal comprises the sensor output signal during a first time duration and an inverted sensor output signal during a second different time duration.
A circuit method in an integrated circuit, comprising:
- from a sensor, generating a sensor output signal;
- and
- generating a self-diagnostic signal comprising the sensor output signal during a first time duration and comprising an inverted sensor output signal during a second different time duration.
Dependencies are inferred from the claim text.