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US 7,796,149 B2Granted
Method for scanner control in at least one scan axis in a laser scanning microscope
AssigneeCarl Zeiss MicroImaging GmbH
InventorJoerg Steinert
Life of this patent
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Abstract
Method for scanner control in at least one scan axis in a laser scanning microscope, the scan field being divided into partial area, a first image of at least one partial area produced by a forward scan being compared with a second image of the partial area produced by a back scan and a correction value for the scanner control determined from the deviation between the first and second image.
Claims15
A method for scanner control in at least one scan axis in a laser scanning microscope in which a scan field is scanned line-by-line, comprising the steps of:
- dividing the scan field into strips, in which the longitudinal axis of the strips is perpendicular to the direction of the scan lines;
- subdividing the strips into a respective first partial image of forward scan lines and a respective second partial image of back scan lines;
- for each strip, comparing at least the respective first partial image with at least the second partial image to determine deviations between the first and second partial images;
- and
- determining correction values for scanner control from the deviations between the first and second partial images.
2 more elements
Dependencies are inferred from the claim text.